VT321 Semiconductor Parameter Tester-武汉微泰电子有限公司

: VT321 Semiconductor Parameter Tester

The VT321 semiconductor parameter tester supports PXIe standard modules such as SMU, LCR, PGU, and PMU, meeting complex testing requirements. It is equipped with a 15.6-inch high-definition screen, pre-installed with Windows 10 and VTNext software. It offers I-V, C-V, and pulsed I-V testing functions. With a built - in rich device type library including MOSFETs, BJTs, diodes, resistors, and capacitors, it provides advanced test definition, parameter analysis, chart plotting, and automation functions for the characterization of modern semiconductors, materials, and processes.

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Characteristic Parameter Accessory Resource

The high-precision source measurement unit offers four-quadrant output.
It enables high-speed measurement with a sampling rate of 1.8 MS/s.
The voltage range is ±200V, and the voltage sensitivity is 100nV.
The current range is ±1A (DC) and ±3A (pulse), with a current sensitivity of 10fA.
It features excellent human-machine interaction design. You can operate graphical controls, and also achieve customized measurements by writing scripts.

名称	版本	发布时间	下载
VT321 数据手册	1.0	2025-01-17	点击下载